ListarRevista Politechnê por tema "Amorphous semiconductors"
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Determination of interface roughness and its correlation in amorphous-silicon/ amorphous-germanium multilayers
(Polytechnic University of Puerto Rico, 1996-06)The importance of surfaces and interfaces of materials is increasing in many technological areas. In the microelectronic industry, for example, the J current trend is toward even faster and smaller electronic devices. ...