dc.rights.license | All rights reserved | en_US |
dc.contributor.advisor | Nieves Castro, Rafael A. | |
dc.contributor.author | Armbruster Santiago, Eric | |
dc.date.accessioned | 2020-09-16T15:40:37Z | |
dc.date.available | 2020-09-16T15:40:37Z | |
dc.date.issued | 2015 | |
dc.identifier.citation | Armbruster Santiago, E. (2015). First pass yield metric implementation for validation documents [Unpublished manuscript]. Graduate School, Polytechnic University of Puerto Rico. | en_US |
dc.identifier.uri | http://hdl.handle.net/20.500.12475/613 | |
dc.description | Design Project Article for the Graduate Programs at Polytechnic University of Puerto Rico. | en_US |
dc.description.abstract | A regulatory compliance contractor in
the life sciences industry desires to be distinguished
from its competitors in terms of the quality of their
services. To make it possible, the company intends
to improve the validation test case development
process in order to implement a metric that shows
how much time they are saving their customers by
delivering defect-free test cases to the approval
process. This metric is known as the First Time
Yield and measures the proportion of documents
that are reworked during the approval process. To
achieve this goal, the DMAIC methodology was
used to gain a better insight of the process and the
areas of opportunity. After following this structure,
the baseline FPY value was improved from 66% to
80.5% with only the first stage of solutions
proposed. This improvement reduced 6-15 hours of
re-approving defective test cases. With this
reduction, the client can allocate their resources
into more valuable activities while complying with
the project deadlines.
Key Terms - Defect, FPY, Rejections,
Validation. | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | Polytechnic University of Puerto Rico | en_US |
dc.relation.ispartof | Manufacturing Engineering; | |
dc.relation.ispartofseries | Fall-2015; | |
dc.relation.haspart | San Juan | en_US |
dc.subject.lcsh | Six sigma (Quality control standard) | en_US |
dc.subject.lcsh | Polytechnic University of Puerto Rico--Graduate students--Research | |
dc.title | First Pass Yield Metric Implementation for Validation Documents | en_US |
dc.type | Article | en_US |
dc.rights.holder | Polytechnic University of Puerto Rico, Graduate School | en_US |