Mostrar el registro sencillo del ítem

dc.rights.licenseAll rights reserveden_US
dc.contributor.advisorNieves Castro, Rafael A.
dc.contributor.authorArmbruster Santiago, Eric
dc.date.accessioned2020-09-16T15:40:37Z
dc.date.available2020-09-16T15:40:37Z
dc.date.issued2015
dc.identifier.citationArmbruster Santiago, E. (2015). First pass yield metric implementation for validation documents [Unpublished manuscript]. Graduate School, Polytechnic University of Puerto Rico.en_US
dc.identifier.urihttp://hdl.handle.net/20.500.12475/613
dc.descriptionDesign Project Article for the Graduate Programs at Polytechnic University of Puerto Rico.en_US
dc.description.abstractA regulatory compliance contractor in the life sciences industry desires to be distinguished from its competitors in terms of the quality of their services. To make it possible, the company intends to improve the validation test case development process in order to implement a metric that shows how much time they are saving their customers by delivering defect-free test cases to the approval process. This metric is known as the First Time Yield and measures the proportion of documents that are reworked during the approval process. To achieve this goal, the DMAIC methodology was used to gain a better insight of the process and the areas of opportunity. After following this structure, the baseline FPY value was improved from 66% to 80.5% with only the first stage of solutions proposed. This improvement reduced 6-15 hours of re-approving defective test cases. With this reduction, the client can allocate their resources into more valuable activities while complying with the project deadlines. Key Terms - Defect, FPY, Rejections, Validation.en_US
dc.language.isoen_USen_US
dc.publisherPolytechnic University of Puerto Ricoen_US
dc.relation.ispartofManufacturing Engineering;
dc.relation.ispartofseriesFall-2015;
dc.relation.haspartSan Juanen_US
dc.subject.lcshSix sigma (Quality control standard)en_US
dc.subject.lcshPolytechnic University of Puerto Rico--Graduate students--Research
dc.titleFirst Pass Yield Metric Implementation for Validation Documentsen_US
dc.typeArticleen_US
dc.rights.holderPolytechnic University of Puerto Rico, Graduate Schoolen_US


Ficheros en el ítem

Thumbnail

Este ítem aparece en la(s) siguiente(s) colección(ones)

Mostrar el registro sencillo del ítem