Mostrar el registro sencillo del ítem

dc.rights.licenseAll rights reserveden_US
dc.contributor.advisorAvilés Segundo, Iván M.
dc.contributor.authorMontanez, José Ian
dc.date.accessioned2021-08-18T12:36:12Z
dc.date.available2021-08-18T12:36:12Z
dc.date.issued2021
dc.identifier.citationMontanez, J. I. (2021). SICD Terminal Ring Cracks Reduction [Unpublished manuscript]. Graduate School, Polytechnic University of Puerto Rico.en_US
dc.identifier.urihttp://hdl.handle.net/20.500.12475/1135
dc.descriptionDesign Project Article for the Graduate Programs at Polytechnic University of Puerto Ricoen_US
dc.description.abstractA medical device manufacturing line of cadioverter/defibrillators utilizes a mechanical process called staking to join two metal components as part of the electrode manufacturing process. The staking process exerts a vertical force into the metal components to deformed them and join them together. In some instances, the deformation experienced during the staking process causes small cracks or fractures on the metal component ring. The objective of this project is to reduce crack yield fallout at the staking process. Utilizing process improvement methodology from six sigma Define, Measure, Analyze, Improve and Control (DMAIC) permanent solution was implemented by reducing variation on metal ring component being staked which resulted in 95% yield improvement on crack defect. The project provided financial benefit to the medical device company reducing annual scrap of manufacturing product. Key Terms ⎯ cracks, DMAIC, wall thickness, yield fallouten_US
dc.language.isoen_USen_US
dc.publisherPolytechnic University of Puerto Ricoen_US
dc.relation.ispartofManufacturing Competitiveness Program;
dc.relation.ispartofseriesSpring-2021;
dc.relation.haspartSan Juanen_US
dc.subject.lcshPolytechnic University of Puerto Rico--Graduate students--Researchen_US
dc.subject.lcshPolytechnic University of Puerto Rico--Graduate students--Postersen_US
dc.subject.lcshSix sigma (Quality control standard)en_US
dc.subject.lcshWelded joints--Cracking
dc.titleSICD Terminal Ring Cracks Reductionen_US
dc.typeArticleen_US
dc.rights.holderPolytechnic University of Puerto Rico, Graduate Schoolen_US


Ficheros en el ítem

Thumbnail
Thumbnail

Este ítem aparece en la(s) siguiente(s) colección(ones)

Mostrar el registro sencillo del ítem